Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods availableBOTTON, G. A; BOOTHROYD, C. B; STOBBS, W. M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 93-107, issn 0304-3991Conference Paper

A re-emitted positron energy spectrometerGOODYEAR, A; COLEMAN, P. G.Measurement science & technology (Print). 1995, Vol 6, Num 4, pp 415-421, issn 0957-0233Article

Atomic ratios determined by EELS under parallel and convergent illumination conditionsSU, D. S; WANG, H. F.Ultramicroscopy. 1995, Vol 57, Num 4, pp 323-325, issn 0304-3991Article

Intercomparison of algorithms for background correction in XPSJANSSON, C; TOUGAARD, S; ANDERSON, C. A et al.Surface and interface analysis. 1995, Vol 23, Num 7-8, pp 484-494, issn 0142-2421Article

New electrostatic cylindrical energy analyzerILYIN, A. M; ILYINA, I. A.Optik (Stuttgart). 2007, Vol 118, Num 7, pp 350-352, issn 0030-4026, 3 p.Article

Probing the dynamics of confined systems with the NIST backscattering spectrometerDIMEO, R. M; NEUMANN, D. A.Journal de physique. IV. 2000, Vol 10, Num 7, pp Pr7.337-Pr7.340, issn 1155-4339Conference Paper

A new apparatus for impact collision ion scattering spectroscopyKAWAMOTO, K; INARI, K; MORI, T et al.Japanese journal of applied physics. 1995, Vol 34, Num 9A, pp 4917-4919, issn 0021-4922, 1Article

The development of Auger spectroscopy as a probe of local electronic structureWEIGHTMAN, P.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 3, pp 263-288, issn 1154-2799Article

Analyzing line scan EELS data with neural pattern recognitionGATTS, C; DUSCHER, G; MÜLLEJANS, H et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 229-239, issn 0304-3991Conference Paper

Development of the EXELFS technique for high accuracy structural informationQIAN, M; SARIKAYA, M; STERN, E. A et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 137-147, issn 0304-3991Conference Paper

Recent studies of near-edge structureBROWN, L. M; WALSH, C. A; DRAY, A et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 121-125, issn 1154-2799Conference Paper

Enhanced resolution of depth profiles using two-dimensional XPS dataAMINOV, K. L; JORGENSEN, J. S; BOIDEN PEDERSEN, J et al.Surface and interface analysis. 1996, Vol 24, Num 1, pp 23-27, issn 0142-2421Article

Savitzky and Golay differentiation in AESGILMORE, I. S; SEAH, M. P.Applied surface science. 1996, Vol 93, Num 3, pp 273-280, issn 0169-4332Article

Sources of internal scattering of electrons in a cylindrical mirror analysis (CMA)EL GOMATI, M. M; EL BAKUSH, T. A.Surface and interface analysis. 1996, Vol 24, Num 3, pp 152-162, issn 0142-2421Article

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Determination of the spectrometer transmission function of XPS quantitative analysisZOMMER, L.Vacuum. 1995, Vol 46, Num 5-6, pp 617-620, issn 0042-207XConference Paper

Interactive image-spectrum EELS: application to elemental mapping of lubricant colloidsMARTIN, J.-M; LAVERGNE, J.-L; VACHER, B et al.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 1, pp 53-63, issn 1154-2799Conference Paper

Quantitative surface chemical mapping with Auger and backscattered electron signalsPRUTTON, M; BARKSHIRE, I. R; CRONE, M et al.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 47-62, issn 0304-3991Conference Paper

Resolution enhancement of ultrasonic defect signals for crack sizingSHAKIBI, B; HONARVAR, F; MOLES, M. D. C et al.NDT & E international. 2012, Vol 52, pp 37-50, issn 0963-8695, 14 p.Article

Improved background-fitting algorithms for ionization edges in electron energy-loss spectraEGERTON, R. F; MALAC, M.Ultramicroscopy. 2002, Vol 92, Num 2, pp 47-56, issn 0304-3991, 10 p.Article

Influence of the movement of over full-length cavity cylindrical samples along the x-axis of a double TE₁₀₄ and a single TE₁₀₂ rectangular cavity on the electron paramagnetic resonance An unusual effect analysisMAZUR, Milan; VALKO, Marian; MORRIS, Harry et al.Analytica chimica acta. 2001, Vol 443, Num 1, pp 127-141, issn 0003-2670Article

Positron re-emission from electro-deposited NiWGRYNSZPAN, R. I; COLEMAN, P. G.Measurement science & technology (Print). 2001, Vol 12, Num 2, pp 163-166, issn 0957-0233Article

Two-dimensional analysis of fluctuation in an inductively coupled plasma by a spectrovideo cameraFUKUI, Sayoko; TSUGE, Shin; KITAGAWA, Kuniyuki et al.Microchemical journal. 2001, Vol 68, Num 2-3, pp 225-231, issn 0026-265XConference Paper

The orientation-dependent simulation of ELNESHEBERT-SOUCHE, C; LOUF, P.-H; BLAHA, P et al.Ultramicroscopy. 2000, Vol 83, Num 1-2, pp 9-16, issn 0304-3991Article

Solid state analysis with the new Leipzig high-energy ion nanoprobeVOGT, J; FLAGMEYER, R.-H; HEITMANN, J et al.Mikrochimica acta (1966. Print). 2000, Vol 133, Num 1-4, pp 105-111, issn 0026-3672Conference Paper